In this article, the zero-inflated non-central negative binomial(ZINNB) distribution is introduced. Some of its basic properties are obtained. In addition, we use the maximum likelihood estimation method to estimate t...In this article, the zero-inflated non-central negative binomial(ZINNB) distribution is introduced. Some of its basic properties are obtained. In addition, we use the maximum likelihood estimation method to estimate the parameters of the ZINNB distribution, and illustrate its application by fitting the actual data sets.展开更多
In this paper,we consider testing the hypothesis concerning the means of two independent semicontinuous distributions whose observations are zero-inflated,characterized by a sizable number of zeros and positive observ...In this paper,we consider testing the hypothesis concerning the means of two independent semicontinuous distributions whose observations are zero-inflated,characterized by a sizable number of zeros and positive observations from a continuous distribution.The continuous parts of the two semicontinuous distributions are assumed to follow a density ratio model.A new two-part test is developed for this kind of data.The proposed test takes the sum of one test for equality of proportions of zero values and one conditional test for the continuous distribution.The test is proved to follow a 2 distribution with two degrees of freedom.Simulation studies show that the proposed test controls the type I error rates at the desired level,and is competitive to,and most of the time more powerful than two popular tests.A real data example from a dietary intervention study is used to illustrate the usefulness of the proposed test.展开更多
针对集成电路中差分信号的差分电压和共模电压采用固定输出状态测试,信号的频率采用脉冲计数法测试,由于差分电压与频率需分别测试,导致测试效率偏低,且操作较繁琐、人为引入的不确定性较大,测试方法与数据不可溯源,不适合批量筛选测试...针对集成电路中差分信号的差分电压和共模电压采用固定输出状态测试,信号的频率采用脉冲计数法测试,由于差分电压与频率需分别测试,导致测试效率偏低,且操作较繁琐、人为引入的不确定性较大,测试方法与数据不可溯源,不适合批量筛选测试。为此,提出了一种基于自动化测试系统(Automatic Test Equipment,ATE)中时间测量单元(Time Measurement Unit,TMU)的扫描测试方法,TMU通过测量信号相同幅值两点间的时间差计算得到频率,同时采用扫描法得到差分信号幅值的极值,进而得到差分电压和共模电压。通过对时钟恢复器的测试实验,验证了测试结果与差分信号的实际波形一致,满足器件的性能指标,表明该测试方法稳定可靠、效率高、自动化程度高、可溯源性强,可广泛应用于集成电路的批量测试中。展开更多
微控制器(Microcontroller Unit,MCU)芯片以其高性能、多功能、可编程等优点被广泛应用于各种信号处理和嵌入式系统。MCU芯片测试是保证产品可靠性的重要手段之一,由于市场上的MCU芯片愈发多样化,如何实现高性能和复杂功能的高效测试是...微控制器(Microcontroller Unit,MCU)芯片以其高性能、多功能、可编程等优点被广泛应用于各种信号处理和嵌入式系统。MCU芯片测试是保证产品可靠性的重要手段之一,由于市场上的MCU芯片愈发多样化,如何实现高性能和复杂功能的高效测试是MCU芯片测试的难点。论文针对一款32位高性能MCU芯片,基于自动测试设备(Automatic Test Equipment,ATE)开展了MCU芯片在线测试技术研究,详细说明了MCU电性能测试系统的硬件电路设计方法和软件程序实现流程,实现了批量MCU芯片的产线测试,保障了MCU芯片的可靠性。展开更多
文摘In this article, the zero-inflated non-central negative binomial(ZINNB) distribution is introduced. Some of its basic properties are obtained. In addition, we use the maximum likelihood estimation method to estimate the parameters of the ZINNB distribution, and illustrate its application by fitting the actual data sets.
基金Supported by the National Natural Science Foundation of China(No.11971433)the First Class Discipline of Zhejiang-A(Zhejiang Gongshang University-Statistics)the Intramural Research Program of the Eunice Kennedy Shriver National Institute of Child Health and Human Development.
文摘In this paper,we consider testing the hypothesis concerning the means of two independent semicontinuous distributions whose observations are zero-inflated,characterized by a sizable number of zeros and positive observations from a continuous distribution.The continuous parts of the two semicontinuous distributions are assumed to follow a density ratio model.A new two-part test is developed for this kind of data.The proposed test takes the sum of one test for equality of proportions of zero values and one conditional test for the continuous distribution.The test is proved to follow a 2 distribution with two degrees of freedom.Simulation studies show that the proposed test controls the type I error rates at the desired level,and is competitive to,and most of the time more powerful than two popular tests.A real data example from a dietary intervention study is used to illustrate the usefulness of the proposed test.
文摘针对集成电路中差分信号的差分电压和共模电压采用固定输出状态测试,信号的频率采用脉冲计数法测试,由于差分电压与频率需分别测试,导致测试效率偏低,且操作较繁琐、人为引入的不确定性较大,测试方法与数据不可溯源,不适合批量筛选测试。为此,提出了一种基于自动化测试系统(Automatic Test Equipment,ATE)中时间测量单元(Time Measurement Unit,TMU)的扫描测试方法,TMU通过测量信号相同幅值两点间的时间差计算得到频率,同时采用扫描法得到差分信号幅值的极值,进而得到差分电压和共模电压。通过对时钟恢复器的测试实验,验证了测试结果与差分信号的实际波形一致,满足器件的性能指标,表明该测试方法稳定可靠、效率高、自动化程度高、可溯源性强,可广泛应用于集成电路的批量测试中。
文摘微控制器(Microcontroller Unit,MCU)芯片以其高性能、多功能、可编程等优点被广泛应用于各种信号处理和嵌入式系统。MCU芯片测试是保证产品可靠性的重要手段之一,由于市场上的MCU芯片愈发多样化,如何实现高性能和复杂功能的高效测试是MCU芯片测试的难点。论文针对一款32位高性能MCU芯片,基于自动测试设备(Automatic Test Equipment,ATE)开展了MCU芯片在线测试技术研究,详细说明了MCU电性能测试系统的硬件电路设计方法和软件程序实现流程,实现了批量MCU芯片的产线测试,保障了MCU芯片的可靠性。
