In this paper, we have proposed and demonstrated a simple approach to fabricate vertical integrated structure for coupling between active germanium (Ge) waveguide and silicon-on-insulator (SOI) waveguide. The active G...In this paper, we have proposed and demonstrated a simple approach to fabricate vertical integrated structure for coupling between active germanium (Ge) waveguide and silicon-on-insulator (SOI) waveguide. The active Ge waveguide is sputtered after etching the underlying passive silicon (Si) waveguide. This method scuttles away from the difficulty involved in the waveguide fabrication by avoiding the etching process for the Ge waveguide, and thereby the waveguide quality is improved. The influences of the coupling structural parameters on the coupling loss are analyzed and discussed. The optimizing parameters are obtained for the fabrication. The minimal coupling loss is experimentally measured about 2.37 dB, and variation tendency of coupling loss against the structural parameters is consistent with the theoretical result. The proposed approach offers an effective path for vertical coupling between Ge and SOI optical components.展开更多
基金This work was supported by the National Natural Science Foundation of China (NSFC)(Grant No. 61435004).
文摘In this paper, we have proposed and demonstrated a simple approach to fabricate vertical integrated structure for coupling between active germanium (Ge) waveguide and silicon-on-insulator (SOI) waveguide. The active Ge waveguide is sputtered after etching the underlying passive silicon (Si) waveguide. This method scuttles away from the difficulty involved in the waveguide fabrication by avoiding the etching process for the Ge waveguide, and thereby the waveguide quality is improved. The influences of the coupling structural parameters on the coupling loss are analyzed and discussed. The optimizing parameters are obtained for the fabrication. The minimal coupling loss is experimentally measured about 2.37 dB, and variation tendency of coupling loss against the structural parameters is consistent with the theoretical result. The proposed approach offers an effective path for vertical coupling between Ge and SOI optical components.
