期刊文献+
共找到28,340篇文章
< 1 2 250 >
每页显示 20 50 100
基于FPGASoC的FM数字基带调制信号源的设计
1
作者 刘茂洋 史艳高 《科技视界》 2024年第25期120-123,共4页
文章针对物联网无线数据传输应用场景,基于FPGA-SoC设计了一款FM数字基带调制信号源。该信号源采用了RISC-V微处理器作为控制单元,实现了对基带已调信号频率的灵活控制;通过对信号源的架构设计,将FPGA的灵活性和FM数字调制的抗干扰特点... 文章针对物联网无线数据传输应用场景,基于FPGA-SoC设计了一款FM数字基带调制信号源。该信号源采用了RISC-V微处理器作为控制单元,实现了对基带已调信号频率的灵活控制;通过对信号源的架构设计,将FPGA的灵活性和FM数字调制的抗干扰特点相结合。仿真与原型验证表明该信号源具有延时低、易集成、灵活性好等优点。 展开更多
关键词 数字基带 FM调制 FPGA RISC-V SOC
在线阅读 下载PDF
基于FPGAs的智能机器人导航系统 被引量:4
2
作者 林雄 郑千里 +1 位作者 黄槐仁 刘煜 《计算机工程与设计》 CSCD 北大核心 2005年第3期586-587,600,共3页
现场可编程门阵列(FPGAs)是超大规模可编程专用集成电路,进化算法是能够在线自适应的硬件,它包括进化系统、遗传算法和遗传编程,算法从生物学上求解待定问题的计算方法得到灵感。给出一种基于FPGAs 的新的进化算法,算法中的种群由联想... 现场可编程门阵列(FPGAs)是超大规模可编程专用集成电路,进化算法是能够在线自适应的硬件,它包括进化系统、遗传算法和遗传编程,算法从生物学上求解待定问题的计算方法得到灵感。给出一种基于FPGAs 的新的进化算法,算法中的种群由联想种群和改进种群两个子种群组成且可动态地可重配置,对改进种群中的每个染色体都使用复制、变异和选择操作,不对联想种群而只对改进种群进行变异操作,算法成功地导航机器人在复杂变化的环境中实现避碰。 展开更多
关键词 智能机器人 进化算法 FPGA 避碰 大规模 硬件 可重配置 专用集成电路 现场可编程门阵列 自适应
在线阅读 下载PDF
Fault Tolerant Design of Large-Scale Digital Beam Forming in SRAM-FPGAs for Software Defined Satellite Platforms 被引量:2
3
作者 Zhen Gao Jinhua Zhu +4 位作者 Tong Yan Linghua Guo Xiangping Chen Yinqiao Li Xiaolei Wan 《China Communications》 SCIE CSCD 2020年第7期67-79,共13页
Large scale digital beamforming(LS-DBFs)are widely used in satellite communications for spectrum reuse and transmission enhancement.SRAM-FPGAs are a popular option for software defined satellite platforms due to their... Large scale digital beamforming(LS-DBFs)are widely used in satellite communications for spectrum reuse and transmission enhancement.SRAM-FPGAs are a popular option for software defined satellite platforms due to their rich computation resources and high flexibility.However,they are sensitive to soft errors,which limit their application in space.This paper discusses the application of coding based fault tolerance schemes for the protection of LS-DBFs on software defined payloads.Since multiple FPGAs are usually needed to support the whole LS-DBFs system,different decomposition schemes are compared in terms of resource efficiency and reliability when the coding based scheme is applied to protect the DBFs on a FPGA.Theoretical analysis and hardware experiments shows that resource efficiency and reliability are a pair of contradictory requirements for decomposition schemes.The protection with vertical decomposition could improve the reliability by 96%with 1.5x redundancy.And the protection with horizontal decomposition could improve the reliability by 85%with 1.2 x redundancy. 展开更多
关键词 fpgas PAYLOAD HARDWARE
在线阅读 下载PDF
Heavy ion‑induced MCUs in 28nm SRAM‑based FPGAs:upset proportions,classifications,and pattern shapes 被引量:1
4
作者 Shuai Gao Xin‑Yu Li +7 位作者 Shi‑Wei Zhao Ze He Bing Ye Li Cai You‑Mei Sun Guo‑Qing Xiao Chang Cai Jie Liu 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2022年第12期128-137,共10页
For modern scaling devices,multiple cell upsets(MCUs)have become a major threat to high-reliability field-programmable gate array(FPGA)-based systems.Thus,both performing the worst-case irradiation tests to provide th... For modern scaling devices,multiple cell upsets(MCUs)have become a major threat to high-reliability field-programmable gate array(FPGA)-based systems.Thus,both performing the worst-case irradiation tests to provide the actual MCU response of devices and proposing an effective MCU distinction method are urgently needed.In this study,high-and medium-energy heavy-ion irradiations for the configuration random-access memory of 28 nm FPGAs are performed.An MCU extraction method supported by theoretical predictions is proposed to study the MCU sizes,shapes,and frequencies in detail.Based on the extraction method,the different percentages,and orientations of the large MCUs in both the azimuth and zenith directions determine the worse irradiation response of the FPGAs.The extracted largest 9-bit MCUs indicate that high-energy heavy ions can induce more severe failures than medium-energy ones.The results show that both the use of high-energy heavy ions during MCU evaluations and effective protection for the application of high-density 28 nm FPGAs in space are extremely necessary. 展开更多
关键词 fpgas Heavy ions Multiple cell upsets Extraction Worse irradiation
在线阅读 下载PDF
Accurate Interconnection Length and Routing Channel Width Estimates for FPGAs
5
作者 高海霞 马晓华 杨银堂 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第7期1196-1200,共5页
We study the problem of the prediction of interconnection dimensions for FPGAs, including estimating interconnection length and channel width. Experimental results show that our estimates are more accurate than those ... We study the problem of the prediction of interconnection dimensions for FPGAs, including estimating interconnection length and channel width. Experimental results show that our estimates are more accurate than those of existing methods. 展开更多
关键词 FPGA interconnection length estimation channel width estimation
在线阅读 下载PDF
最先进的10万门现场可编程门阵列(FPGAs)
6
作者 徐京晶 《微处理机》 1996年第3期60-64,共5页
本文介绍了国际上最新的10万门FPGA系列,该产品由美国GateField公司研制,采用Flash存储器作为控制码存储单元以及一种和掩膜式门阵列类似的“细粒”可编程逻辑单元,其单元面积大大小于现在市场上的SRAM结构和EPROM结构的FPGA及EPLD... 本文介绍了国际上最新的10万门FPGA系列,该产品由美国GateField公司研制,采用Flash存储器作为控制码存储单元以及一种和掩膜式门阵列类似的“细粒”可编程逻辑单元,其单元面积大大小于现在市场上的SRAM结构和EPROM结构的FPGA及EPLD单元,目前采用0.8μm工艺已达10万门高密度。本文对其多层次“瓦片”式结构也作了较详细介绍。 展开更多
关键词 Flash结构 fpgas 可编程门阵列
在线阅读 下载PDF
FPGAs——支持DSP技术在实时视频处理中的应用 被引量:1
7
作者 David Nicklin 《世界电子元器件》 2002年第5期41-42,共2页
实时视频处理对系统级性能提出了极高的要求,几乎最简单的功能也超出了单个通用DSP器件的处理能力。采用可编程逻辑器件进行设计使工程师可利用并行处理技术实现视频信号处理算法。
关键词 MPEG2 图像处理 fpgas DSP技术 实时视频处理
在线阅读 下载PDF
NEW APPROACH TO EMULATE SEU FAULTS ON SRAM BASED FPGAS
8
作者 Reza Omidi Gosheblagh Karim Mohammadi 《Journal of Electronics(China)》 2014年第1期68-77,共10页
Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Si... Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method. 展开更多
关键词 Field Programmable Gate Arrays(fpgas) Single-Event Upset(SEU) fault injection Soft-core Space radiation effects
在线阅读 下载PDF
灵活性,自动化中FPGAs一体化的关键
9
《工业设计》 2010年第3期38-38,共1页
根据National InstrumentsCorp公司(其是总部在美国德克萨斯州奥斯汀的自动化产品供应商)的LabView研发小组经理MikeTrirnbom的说法“FPGA技术赋予了专属硬件线路可靠性、完全并行执行以及快速闭环控制的特性”
关键词 自动化产品 fpgas INSTRUMENTS 一体化 LABVIEW 活性 FPGA技术 Corp公司
在线阅读 下载PDF
Differences in MBUs Induced by High-energy and Medium-energy Heavy Ions in 28 nm FPGAs
10
作者 Gao Shuai Ye Bing +1 位作者 Liu Jie Xiao Guoqing 《IMP & HIRFL Annual Report》 2022年第1期121-122,共2页
The high performance and exible con guration ability of static random-access memory(SRAM)-based eldprogrammable gate arrays(FPGAs)make them widely used in space missions^([1]).However,they are sensitive to single even... The high performance and exible con guration ability of static random-access memory(SRAM)-based eldprogrammable gate arrays(FPGAs)make them widely used in space missions^([1]).However,they are sensitive to single event upsets(SEUs)caused by heavy ion incidence^([2]).Moreover,as the feature size continues to shrink,the reduction of critical charges and the enhanced ment of charge sharing effects in FPGA lead to multiple-bit upsets(MBUs)occurring more frequently^([3]). 展开更多
关键词 CONTINUE ENERGY fpgas
在线阅读 下载PDF
Heavy Ion-induced MCUs in 28 nm SRAM-based FPGAs:Upset Proportions,Classi cations,and Pattern Shapes
11
作者 Gao Shuai Liu Jie Xiao Guoqing 《IMP & HIRFL Annual Report》 2022年第1期123-124,共2页
Static random-access memory(SRAM)-based eld programmable gate arrays(FPGAs)are sensitive to radiationinduced single event upsets(SEUs)^([1]).Single-bit upsets(SBUs),as a well-known effect in FPGAs,occur when the energ... Static random-access memory(SRAM)-based eld programmable gate arrays(FPGAs)are sensitive to radiationinduced single event upsets(SEUs)^([1]).Single-bit upsets(SBUs),as a well-known effect in FPGAs,occur when the energy deposited by a single particle(such as heavy ion)exceeds the critical charge in single memory cell.However,in modern advanced process technologies,owing to the smaller area and decreased critical charge of transistors. 展开更多
关键词 MCU SRAM fpgas
在线阅读 下载PDF
Optimization of Global Signal Networks for Island-Style FPGAs
12
作者 倪明浩 陈陵都 刘忠立 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第9期1764-1769,共6页
We present a staggered buffer connection method that provides flexibility for buffer insertion while designing global signal networks using the tile-based FPGA design methodology. An exhaustive algorithm is used to an... We present a staggered buffer connection method that provides flexibility for buffer insertion while designing global signal networks using the tile-based FPGA design methodology. An exhaustive algorithm is used to analyze the trade-off between area and speed of the global signal networks for this staggered buffer insertion scheme, and the criterion for determining the design parameters is presented. The comparative analytic result shows that the methods in this paper are proven to be more efficient for FPGAs with a large array size. 展开更多
关键词 circuit design FPGA global signal network OPTIMIZATION buffer insertion
在线阅读 下载PDF
Contribution of the FPGAs for Complex Control Algorithms: Sensorless DTFC with an EKF of an Induction Motor 被引量:4
13
作者 Saber Krim Soufien Gdaim +1 位作者 Abdellatif Mtibaa Mohamed Faouzi Mimouni 《International Journal of Automation and computing》 EI CSCD 2019年第2期226-237,共12页
In a conventional direct torque control(CDTC) of the induction motor drive, the electromagnetic torque and the stator flux are characterized by high ripples. In order to reduce the undesired ripples, several methods a... In a conventional direct torque control(CDTC) of the induction motor drive, the electromagnetic torque and the stator flux are characterized by high ripples. In order to reduce the undesired ripples, several methods are used in the literature. Nevertheless,these methods increase the algorithm complexity and dependency on the machine parameters such as the space vector modulation(SVM). The fuzzy logic control method is utilized in this work to decrease these ripples. Moreover, to eliminate the mechanical sensor the extended kalman filter(EKF) is used, in order to reduce the cost of the system and the rate of maintenance. Furthermore, in the domain of controlling the real-time induction motor drives, two principal digital devices are used such as the hardware(FPGA) and the digital signal processing(DSP). The latter is a software solution featured by a sequential processing that increases the execution time. However, the FPGA is featured by a high processing speed because of its parallel processing. Therefore, using the FPGA it is possible to implement complex algorithms with low execution time and to enhance the control bandwidth. The large bandwidth is the key issue to increase the system performances. This paper presents the interest of utilizing the FPGAs to implement complex control algorithms of electrical systems in real time. The suggested sensorless direct torque control using the fuzzy logic(DTFC) of an induction motor is successfully designed and implemented on an FPGA Virtex 5 using xilinx system generator. The simulation and implementation results show proposed approach s performances in terms of ripples, stator current harmonic waves, execution time, and short design time. 展开更多
关键词 Direct torque CONTROL fuzzy logic CONTROL (FLC) extended Kalman filter XILINX system generator (XSG) field programmable gate array (FPGA)
原文传递
Experimental study on heavy ion single-event effects in flash-based FPGAs 被引量:2
14
作者 Zhen-Lei Yang Xiao-Hui Wang +6 位作者 Hong Su Jie Liu Tian-Qi Liu Kai Xi Bin Wang Song Gu Qian-Shun She 《Nuclear Science and Techniques》 SCIE CAS CSCD 2016年第1期98-105,共8页
With extensive use of flash-based field-programmable gate arrays(FPGAs) in military and aerospace applications, single-event effects(SEEs) of FPGAs induced by radiations have been a major concern. In this paper, we pr... With extensive use of flash-based field-programmable gate arrays(FPGAs) in military and aerospace applications, single-event effects(SEEs) of FPGAs induced by radiations have been a major concern. In this paper, we present SEE experimental study of a flash-based FPGA from Microsemi Pro ASIC3 product family. The relation between the cross section and different linear energy transfer(LET) values for the logic tiles and embedded RAM blocks is obtained. The results show that the sequential logic cross section depends not too much on operating frequency of the device. And the relationship between 0 →1 upsets(zeros) and 1 →0 upsets(ones) is different for different kinds of D-flip-flops. The devices are not sensitive to SEL up to a LET of 99.0 Me V cm2/mg.Post-beam tests show that the programming module is damaged due to the high-LET ions. 展开更多
关键词 Flash 单粒子效应 FPGA 重离子 实验 现场可编程门阵列 设备选择 航天应用
在线阅读 下载PDF
Differences in MBUs induced by high-energy and medium-energy heavy ions in 28 nm FPGAs 被引量:1
15
作者 Shuai Gao Jin-Hu Yang +7 位作者 Bing Ye Chang Cai Ze He Jie Liu Tian-Qi Liu Xiao-Yu Yan You-Mei Sun Guo-Qing Xiao 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2022年第9期28-36,共9页
Multiple-bit upsets(MBUs)have become a threat to modern advanced field-programmable gate arrays(FPGAs)applications in radiation environments.Hence,many investigations have been conducted using mediumenergy heavy ions ... Multiple-bit upsets(MBUs)have become a threat to modern advanced field-programmable gate arrays(FPGAs)applications in radiation environments.Hence,many investigations have been conducted using mediumenergy heavy ions to study the effects of MBU radiation.However,high-energy heavy ions(HEHIs)greatly affect the size and percentage of MBUs because their ionizationtrack structures differ from those of medium-energy heavy ions.In this study,the different impacts of high-energy and medium-energy heavy ions on MBUs in 28 nm FPGAs as well as their mechanisms are thoroughly investigated.With the Geant4 calculation,more serious energy effects of HEHIs on MBU scales were successfully demonstrated.In addition,we identified worse MBU responses resulting from lowered voltages.The MBU orientation effect was observed in the radiation of different dimensions.The broadened ionization tracks for tilted tests in different dimensions could result in different MBU sizes.The results also revealed that the ionization tracks of tilted HEHIs have more severe impacts on the MBU scales than mediumenergy heavy ions with much higher linear energy transfer.Therefore,comprehensive radiation with HEHIs is indispensable for effective hardened designs to apply highdensity 28 nm FPGAs in deep space exploration. 展开更多
关键词 FPGA High-energy heavy-ion radiation MBU Ionization track
在线阅读 下载PDF
Test of an ME Chip Based on FPGAs
16
作者 季振洲 《High Technology Letters》 EI CAS 2000年第2期52-55,共4页
The characteristic of FPGA, motion estimation(ME) and the full search block matching arithmetic were introduced, it analyses the collectivity configuration of basic working flow in ME. Based on FPGA, the study concent... The characteristic of FPGA, motion estimation(ME) and the full search block matching arithmetic were introduced, it analyses the collectivity configuration of basic working flow in ME. Based on FPGA, the study concentrates on the control, computing and test part of ME chip implementation. In the end PCB of ME chip is designed and completed. ME is an important link of MPEG standard on picture compression, whose characteristics is its huge amount of data and computing task. So people often use special chip to meet the requirement, but there is still not such production in China at present. 展开更多
关键词 ME FPGA MPEG
在线阅读 下载PDF
Comparative Performance Evaluation of Large FPGAs with CNFET-and CMOS-based Switches in Nanoscale
17
作者 Mohammad Hossein Moaiyeri Ali Jahanian Keivan Navi 《Nano-Micro Letters》 SCIE EI CAS 2011年第3期178-188,共11页
Routing resources are the major bottlenecks in improving the performance and power consumption of the current FPGAs. Recently reported researches have shown that carbon nanotube field effect transistors(CNFETs) have c... Routing resources are the major bottlenecks in improving the performance and power consumption of the current FPGAs. Recently reported researches have shown that carbon nanotube field effect transistors(CNFETs) have considerable potentials for improving the delay and power consumption of the modern FPGAs. In this paper, hybrid CNFET-CMOS architecture is presented for FPGAs and then this architecture is evaluated to be used in modern FPGAs. In addition, we have designed and parameterized the CNFET-based FPGA switches and calibrated them for being utilized in FPGAs at 45 nm, 22 nm and 16 nm technology nodes.Simulation results show that the CNFET-based FPGA switches improve the current FPGAs in terms of performance, power consumption and immunity to process and temperature variations. Simulation results and analyses also demonstrate that the performance of the FPGAs is improved about 30%, on average and the average and leakage power consumptions are reduced more than 6% and 98% respectively when the CNFET switches are used instead of MOSFET FPGA switches. Moreover, this technique leads to more than 20.31%smaller area. It is worth mentioning that the advantages of CNFET-based FPGAs are more considerable when the size of FPGAs grows and also when the technology node becomes smaller. 展开更多
关键词 Carbon nanotube field effect transistor(CNFET) FPGA switches Performance evaluation Power consumption Process variation
在线阅读 下载PDF
A method to improve PUF reliability in FPGAs
18
作者 Liang Huaguo Li Weidi +1 位作者 Xu Xiumin Wang Haoyu 《Journal of Southeast University(English Edition)》 EI CAS 2018年第1期15-20,共6页
Due to the impact of voltage,temperature and device aging,the traditional ring oscillator-based physical unclonable functions(RO-PUF)suffers from a unreliability issue,i.e.,PUF output is subject to a constant change.T... Due to the impact of voltage,temperature and device aging,the traditional ring oscillator-based physical unclonable functions(RO-PUF)suffers from a unreliability issue,i.e.,PUF output is subject to a constant change.To improve the reliability of the PUF,a stability test scheme related to the PUF mapping unit is proposed.The scheme uses ring oscillators with multiple complexity and various frequencies as sources of interference,which are placed near the PUF prototype circuit to interfere with it.By identifying and discarding unstable slices whichlead to t e instability of PUF,PUF reliability can be effectively improved.Experimental results show that surrounding logic circuits with multiple complexity and multiple frequencies can identify different unstable slices,a d the higher the complexity,t e more unstable slices are detected.Moreover,compared with newly published PUF literature,t e PUF cicuit possesses better statistical characteristic of randomness and lower resource consumption.W it temperatures varying from 0 to 120 t and voltage fluctuating between 0.85 and 1.2 V,its uniqueness and stability can achieve 49.78%a d 98.00%,respectively,which makes it better for use in t e field of security. 展开更多
关键词 field programmable gate aray(FPGA) physical unclonable function(PUF) security ring oscillator(RO) RELIABILITY
在线阅读 下载PDF
Low complexity SEU mitigation technique for SRAM-based FPGAs
19
作者 JIANG Run-zhen WANG Yong-qing +1 位作者 FENG Zhi-qiang YU Xiu-li 《Journal of Beijing Institute of Technology》 EI CAS 2016年第3期403-412,共10页
An internal single event upset(SEU)mitigation technique is proposed,which reads back the configuration frames from the static random access memory(SRAM)-based field programmable gate array(FPGA)through an intern... An internal single event upset(SEU)mitigation technique is proposed,which reads back the configuration frames from the static random access memory(SRAM)-based field programmable gate array(FPGA)through an internal port and compares them with those stored in the radiationhardened memory to detect and correct SEUs.Triple modular redundancy(TMR),which triplicates the circuit of the technique and uses majority voters to isolate any single upset within it,is used to enhance the reliability.Performance analysis shows that the proposed technique can satisfy the requirement of ordinary aerospace missions with less power dissipation,size and weight.The fault injection experiment validates that the proposed technique is capable of correcting most errors to protect spaceborne facilities from SEUs. 展开更多
关键词 static random access memory (SRAM) field programmable gate array (FPGA) single event upset (SEU) low complexity triple modular redundancy SCRUBBING
在线阅读 下载PDF
NI LabVIEW FPGAs预展系统
20
《国外电子元器件》 2003年第3期79-79,共1页
关键词 LabVIEWFPAGs预展系统 NI公司 集成开发系统 FPGA
在线阅读 下载PDF
上一页 1 2 250 下一页 到第
使用帮助 返回顶部