Test selection design(TSD)is an important technique for improving product maintainability,reliability and reducing lifecycle costs.In recent years,although some researchers have addressed the design problem of test se...Test selection design(TSD)is an important technique for improving product maintainability,reliability and reducing lifecycle costs.In recent years,although some researchers have addressed the design problem of test selection,the correlation between test outcomes has not been sufficiently considered in test metrics modeling.This study proposes a new approach that combines copula and D-Vine copula to address the correlation issue in TSD.First,the copula is utilized to model FIR on the joint distribution.Furthermore,the D-Vine copula is applied to model the FDR and FAR.Then,a particle swarm optimization is employed to select the optimal testing scheme.Finally,the efficacy of the proposed method is validated through experimentation on a negative feedback circuit.展开更多
基金supported by the National Natural Science Foundation of China(No.62303293,62303414)the China Postdoctoral Science Foundation(No.2023M732176,2023M741821)the Zhejiang Province Postdoctoral Selected Foundation(No.ZJ2023143).
文摘Test selection design(TSD)is an important technique for improving product maintainability,reliability and reducing lifecycle costs.In recent years,although some researchers have addressed the design problem of test selection,the correlation between test outcomes has not been sufficiently considered in test metrics modeling.This study proposes a new approach that combines copula and D-Vine copula to address the correlation issue in TSD.First,the copula is utilized to model FIR on the joint distribution.Furthermore,the D-Vine copula is applied to model the FDR and FAR.Then,a particle swarm optimization is employed to select the optimal testing scheme.Finally,the efficacy of the proposed method is validated through experimentation on a negative feedback circuit.
