We report that fully transparent resistive random access memory （TRRAM） devices based on ITO/TiO2/ITO sandwich structure, which are prepared by the method of RF magnetron sputtering, exhibit excellent switching stab...We report that fully transparent resistive random access memory （TRRAM） devices based on ITO/TiO2/ITO sandwich structure, which are prepared by the method of RF magnetron sputtering, exhibit excellent switching stability. In the visible region （400 800 nm in wavelength） the TRRAM device has a transmittance of more than 80%. The fabricated TRRAM device shows a bipolar resistance switching behaviour at low voltage, while the retention test and rewrite cycles of more than 300,000 indicate the enhancement of switching capability. The mechanism of resistance switching is further explained by the forming and rupture processes of the filament in the TiO2 layer with the help of more oxygen vacancies which are provided by the transparent ITO electrodes.展开更多
文摘以Na2S溶液为沉积液,在一定的温度、pH值、电压和时间下,采用电化学沉积的方法,在铜衬底上生长出一层质地均匀的蓝色Cu2S薄膜.通过XRD及SEM对样品的化学成分及表面与截面形貌进行表征,对Ag/Cu2S/Cu/Ag结构进行直流I-V及电脉冲诱导电阻转变(EPIR)效应测试.结果表明Ag/Cu2S/Cu/Ag结构的Ag/Cu2S结点处存在明显的EPIR效应,而且相对于单个Ag/Cu2S结点而言,Ag/Cu2S双结点具有更大的结点电阻且EPIR效应更明显.另外,Ag/Cu2S/Cu/Ag结构的EPIR效应还与测量的脉冲参数和测量温度有关.对于本样品而言,最佳测量温度为室温,脉冲宽度t0为0.000 1 s.
基金Project supported by the National Basic Research Program of China (Grant No. 2007CB925002)the National High Technology Research and Development Program of China (Grant No. 2008AA031401)and Chinese Academy of Sciences
文摘We report that fully transparent resistive random access memory （TRRAM） devices based on ITO/TiO2/ITO sandwich structure, which are prepared by the method of RF magnetron sputtering, exhibit excellent switching stability. In the visible region （400 800 nm in wavelength） the TRRAM device has a transmittance of more than 80%. The fabricated TRRAM device shows a bipolar resistance switching behaviour at low voltage, while the retention test and rewrite cycles of more than 300,000 indicate the enhancement of switching capability. The mechanism of resistance switching is further explained by the forming and rupture processes of the filament in the TiO2 layer with the help of more oxygen vacancies which are provided by the transparent ITO electrodes.
