X-ray detectors show potential applications in medical imaging,materials science,and nuclear energy.To achieve high detection efficiency and spatial resolution,many conventional semiconductor materials,such as amorpho...X-ray detectors show potential applications in medical imaging,materials science,and nuclear energy.To achieve high detection efficiency and spatial resolution,many conventional semiconductor materials,such as amorphous selenium,cadmium telluride zinc,and perovskites,have been utilized in direct conversion X-ray detectors.However,these semiconductor materials are susceptible to temperature-induced performance degradation,crystallization,delamination,uneven lattice growth,radiation damage,and high dark current.This study explores a new approach by coupling an FC40 electronic fluorinated liquid with a specialized high-resolution and high-readout-speed complementary metal-oxide-semiconductor(CMOS)pixel array,specifically the Topmetal II−chip,to fabricate a direct conversion X-ray detector.The fluorinated liquid FC40(molecular formula:C_(21)F_(48)N_(2))is an electronic medium that is minimally affected by temperature and displays no issues with uniform conductivity.It exhibits a low dark current and minimal radiation damage and enables customizable thickness in X-ray absorption.This addresses the limitations inherent in conventional semiconductor-based detectors.In this study,simple X-ray detector imaging tests were conducted,demonstrating the excellent coupling capability between FC40 electronic fluorinated liquid and CMOS chips by the X-ray detector.A spatial resolution of 4.0 lp/mm was measured using a striped line par card,and a relatively clear image of a cockroach was displayed in the digital radiography imaging results.Preliminary test results indicated the feasibility of fabricating an X-ray detector by combining FC40 electronic fluorinated liquid and CMOS chips.Owing to the absence of issues related to chip-material coupling,a high spatial resolution could be achieved by reducing the chip pixel size.This method presents a new avenue for studies on novel liquid-based direct conversion X-ray detectors.展开更多
Flexible X-ray detectors have garnered considerable attention owing to their extensive applications in three-dimensional (3D) image reconstruction, disease diagnosis and nondestructive testing^([1-3]). Conventional X-...Flexible X-ray detectors have garnered considerable attention owing to their extensive applications in three-dimensional (3D) image reconstruction, disease diagnosis and nondestructive testing^([1-3]). Conventional X-ray detectors typically employ active-matrix backplanes fabricated on rigid glass substrates, which integrate switching transistors and photodetectors^([4, 5]).展开更多
基金supported by the National Natural Science Foundation of China(No.12235006)the National Key Research and Development Program of China(No.2020YFE0202002.
文摘X-ray detectors show potential applications in medical imaging,materials science,and nuclear energy.To achieve high detection efficiency and spatial resolution,many conventional semiconductor materials,such as amorphous selenium,cadmium telluride zinc,and perovskites,have been utilized in direct conversion X-ray detectors.However,these semiconductor materials are susceptible to temperature-induced performance degradation,crystallization,delamination,uneven lattice growth,radiation damage,and high dark current.This study explores a new approach by coupling an FC40 electronic fluorinated liquid with a specialized high-resolution and high-readout-speed complementary metal-oxide-semiconductor(CMOS)pixel array,specifically the Topmetal II−chip,to fabricate a direct conversion X-ray detector.The fluorinated liquid FC40(molecular formula:C_(21)F_(48)N_(2))is an electronic medium that is minimally affected by temperature and displays no issues with uniform conductivity.It exhibits a low dark current and minimal radiation damage and enables customizable thickness in X-ray absorption.This addresses the limitations inherent in conventional semiconductor-based detectors.In this study,simple X-ray detector imaging tests were conducted,demonstrating the excellent coupling capability between FC40 electronic fluorinated liquid and CMOS chips by the X-ray detector.A spatial resolution of 4.0 lp/mm was measured using a striped line par card,and a relatively clear image of a cockroach was displayed in the digital radiography imaging results.Preliminary test results indicated the feasibility of fabricating an X-ray detector by combining FC40 electronic fluorinated liquid and CMOS chips.Owing to the absence of issues related to chip-material coupling,a high spatial resolution could be achieved by reducing the chip pixel size.This method presents a new avenue for studies on novel liquid-based direct conversion X-ray detectors.
文摘Flexible X-ray detectors have garnered considerable attention owing to their extensive applications in three-dimensional (3D) image reconstruction, disease diagnosis and nondestructive testing^([1-3]). Conventional X-ray detectors typically employ active-matrix backplanes fabricated on rigid glass substrates, which integrate switching transistors and photodetectors^([4, 5]).
