摘要
针对大型检测设备对温度的要求,利用单片机设计温控电路,给出了硬件电路和测试程序流程。
A temperature control circuit was designed with MCS to meet the needs of integrated test system.The hardware circuit and test program flowchart are introduced.
出处
《电光与控制》
2004年第2期71-72,共2页
Electronics Optics & Control
关键词
检测
数据采集
量化
test
data collection
quantification
