摘要
场致发射显微分析术是基于量子隧道效应工作的显微分析术。自问世以来,在它发展的各个阶段,均为当时分辨率最高的显微分析工具。由于它结构简单,分辨率高,直接给出表面原子在正空间的图象,成为研究分析固体表面界面和微观结构的有力工具,受到各发达国家的充分重视。本文简单地回顾和介绍了该技术的发展历史和当前的发展概况,并重点介绍了我们在国家科学基金委员会等部门的资助下研制的“场致发射显微分析综合系统”和运用它所取得的初步成果。
The microanalytic technique of field emission is based on the tunnel effect revealed by quantum mechanics. Since this technique was introduced, it has always exhibited the highest resolution at every stages of its development. Owing to its features of simple structure, high resolution and imaging surface atoms directly in real space, it became one of the most powerful instruments available for the study of surface science and material science, and has attracted much attention. This paper briefly reviews the developing history of this technique, and outlines its recent developments in China. It also reports the newly developed microanalytic combination system of field emission technique sponsored by the NSFC etc., and the achievement obtained so far with the help of the equipment.
出处
《中国科学基金》
CSCD
1992年第2期15-16,共2页
Bulletin of National Natural Science Foundation of China
