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Yb掺杂C_(60)薄膜的x射线光电子能谱研究 被引量：2

X-ray photoemission studies of Yb intercalated C_(60) thin film
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摘要 在超高真空系统中制备了C6 0 的Yb填隙化合物薄膜 .用x射线光电子能谱研究了Yb和C6 0 结合过程中C 1s ,Yb4f和Yb 4d的变化 .利用Yb 4f和C 1s的谱峰强度确定出相纯样品的化学组分接近Yb2 .75C6 0 ,这一结果与晶体x射线衍射结果一致 .Yb 4f和Yb 4d的峰形与峰位表明化合物中Yb的价态为Yb2 + .相纯样品 (Yb2 .75C6 0 )的C 1s峰位相对于纯C6 0 向低结合能方向移动约 0 .5eV .C 1s结合能减小说明有Yb 6s电子转移到C6 0 的最低未充填分子轨道能带上 .结合能变化大小及峰宽的具体数值为进一步在薄膜样品上研究Yb2 .75C6 0 Yb-intercalated C 60 thin film was prepared in a ultra-high-vacuum system. The binding energies of C 1s, Yb 4f and Yb 4d during the compound formation were studied by x-ray photoemission technique. The stoichiometry of the phase-pure sample was determined by the peak intensities of Yb 4f and C 1s. The result turned to be very near to that for Yb 2.75C 60 that was first determined for bulk-phase sample by x-ray diffraction measurement. The positions and intensities of the Yb 4f and Yb 4d peaks revealed the charge state of Yb 2+ in Yb 2.75C 60. The C 1s core level for the phase-pure sample shifted towards lower binding energy by ≈0.5 eV relative to C 60, which exhibited that some Yb 6s electrons transferred from Yb to the lowest unoccupied molecular orbital band of C 60. The shift and the FWHM of C 1s x-ray photoemission spectroscopic peak can be used as sample characterization in future researches on Yb/C 60 compounds.
作者 何少龙 李宏年 李海洋 张寒洁 吕斌 何丕模 鲍世宁 徐亚伯
机构地区 浙江大学物理系中心实验室
出处 《物理学报》 SCIE EI CAS CSCD 北大核心 2004年第3期915-921,共7页 Acta Physica Sinica
基金 国家自然科学基金 (批准号 :10 0 740 5 3 ) 浙江省自然科学基金 (批准号 :10 0 0 19) 北京正负电子对撞机同步辐射实验室资助的课题~~
关键词 镱掺杂 C60薄膜 X射线光电子能谱 镱价态 镱填隙化合物薄膜 Yb intercalated C 60 thin film, XPS, charge state of Yb
分类号 O484.4 [理学—固体物理]
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参考文献15

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同被引文献20

  • 1王晓雄,李宏年,钱海杰,苏润,钟俊,洪才浩,王嘉欧.Sm富勒烯的价带光电子能谱[J].物理学报,2006,55(8):4265-4270. 被引量：2
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物理学报
2004年 第3期

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