摘要
一台新的利用光热偏折技术测试光学薄膜中导波的传播衰减的实验装置。借鉴波导光学中传播衰减来表征高质量光学薄膜的损耗与质量。实验结果表明衰减系数能很灵敏、全面反映出薄膜的性能与质量。
A new experimental set-up has been built for measuring the guided modes attenuations in the optical thin film samples.The attenuation coefficient is used to characterize the loss of high quality thin film samples.The experimental results show that the attenuation coefficient can presentnot only sensitively,but also completely the performence and quality of thethin film samples.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
1992年第3期233-239,共7页
Chinese Journal of Scientific Instrument
