摘要
结合等离子体显示器件 ( PDP)的放电机理 ,论述了 PDP中 Mg O保护膜的二次电子发射过程 :势能型发射和动能型发射。讨论了两种二次电子发射系数 γ的测量方法和装置 ,在此基础上 ,建立了一套简单可行的适用于 PDP样品的实验装置 ,文中给出γ值的测量结果。通过γ值的测试 ,可以反馈 Mg O保护膜的性能 。
Based on the mech anism of discharge of plasma display pan el (PDP),this paper describes the proces s of the secondary electron emission γ of MgO film including potential emissio n and kinetic emission.Also it is discus sed for two kinds of schemes to measure the se condary electron emission coefficient.Th e set of simple and feasible measure equ ipment is established,which can measure γ of MgO film about PDP sample.The exp eriment results are given.The γ value is fed back to characteristic of MgO fil m for im proving the luminance and luminance effi ciency of PDP devices.
出处
《固体电子学研究与进展》
CAS
CSCD
北大核心
2003年第4期416-420,446,共6页
Research & Progress of SSE
