摘要
本文简要地介绍了一种测定晶体结构的新方法．此法立足于一幅高分辨电子显微像及相应的电子衍射花样．它实际上是一种借助于衍射分析技术的图像处理方法，共分二步：像的解卷和提高像的分辨率．第一步是把一幅在任意离焦条件下拍摄的像转换成结构像；第二步是用相位外推技术提高像的分辨率．最终结构像的分辨率将超出电子显微镜分辨本领的限制．
A new approach to crystal structure determination based on a single high resolution electron microscope image and the corresponding electron diffraction pattern is introduced. This is, in fact, a kind of image processing by means of an electron diffraction analysis technique and contains two steps: image deconvolution and resolution enhancement. In the first step the image, taken under arbitrary defocussed conditions, is transformed into the structure image; in the second step the image resolution is enhanced by a phase extension technique. The resolution of the final structure image exceeds the resolution limit of the electron microscopy.
出处
《物理》
CAS
北大核心
1992年第4期202-205,207,共5页
Physics
