摘要
采用电子电离技术研究了全碳分子C_60和C_70的正、负离子质谱,观察到了正离子质谱中的三电荷离子,测定了正离子质谱中双电荷离子与电子能量的关系,以及负离子质谱中分子离子丰度与电子能量的关系。
The paper reports the positive and negative ion mass spectrometry of C_60 and C_70 using electron ionization and In-Beam method. The triply charged ions have been observed in the positive ion mass spectra. The relative inten- sity of doubly and triply charged ions were affected strongly by electron energy. Relationship between the intensity of negative molecular ions and electron energy has been reported as well.
出处
《武汉大学学报（自然科学版）》
CSCD
1992年第3期135-138,共4页
Journal of Wuhan University(Natural Science Edition)
关键词
C60
C70
多电荷离子
质谱
C_60/C_70
multiply charged ion
negative ion mass spectrometry
