摘要
本文对模拟电路的可测性作了分析与探讨,提出了一种新的可测性分析方法——拓扑节点可观度分析法,从而使可测性分析与设计有了定量化依据。文中引入了拓扑可观的概念;给出了定量分析步骤及可观度计算公式。文中还讨论了以节点可观度为依据的测试点自动选取方法,给出了分析算法及应用实例。
Tie testability of analog fault diagnosis is studied. A new analysis method of testability-Node topological observability analysis is presented. The concept of topological observability is introduced, the analysis method is investigated and explained then.An automatic test points selecting algorithm based on node topological observability analysis is presented and the computer aided analysis results are given.
出处
《通信学报》
EI
CSCD
北大核心
1992年第1期82-85,共4页
Journal on Communications
