摘要
目的 :通过检查腮腺术后面神经电图 ,研究其相关指标在评价面神经损伤中的特定意义。方法 :选择 5 0例单侧型腮腺良性肿瘤患者 ,术前 2 4小时及术后 3天、1 0天、2 0天、6 0天、80天、1 0 0天进行面神经电图检查 ,记录波幅值 (Am)、潜伏值 (LT)、动作电位持续时间DT ,并计算神经变性率 (DR)。结果 :术后 3天起各指标较正常水平有显著改变 ,并在 1 0天达到高峰 ,2 0天后呈现修复状态 ,80天后修复能力显著下降。结论 :多数情况下腮腺良性肿瘤所致的面神经损伤属于可逆性的神经失用。DT、LT对神经变构较敏感 ,DR、Am。
Objective:To study the implications of electroneurography in evaluating the facial nerve injury caused by parotidectomy.Methods:Eletroneurography (ENoG)was applied to 50 patients with unilateral benign parotid gland trmors at the time of 24 hours before operation and 3 ,10 ,20 ,40 ,60 ,80 ,100 day postoperative intervals.The detected indexes included amplitute(Am),latency time(LT),and duration time(DT)of action potential,and degeneration rate (DR) as calculated.Results:After 3 day intrerval,DR,Am,LT,and DT showed marked changes and reached summit reflect at 10 day.An evident recovery of the facial nerve was manifested from 20 to 40 days,while.the recovery after 80 days slowed down.Conclusion:The facial nerve injury caused by parotidectomy mostly belongs to one type of reversible facial neurapraxia.LT and DT are sensitive indicators for structural nerve damages,while DR and Am mainly reflect nerve degeneration and the transforming process from degeneration to regeneration.
出处
《北京口腔医学》
CAS
2003年第4期205-207,共3页
Beijing Journal of Stomatology
