摘要
将微量硅酸钠以不同浓度的水溶液形式掺杂到蓝色氧化钨中并在相同的条件下还原成钨粉。结果表明,还原钨粉的粒度随硅酸钠掺杂量的增加而增加,少量掺杂还使还原钨粉的松装密度增加。对还原钨粉表面的扫描电镜及x射线光电子能谱分析结果显示,掺杂到蓝色氧化钨中的硅酸钠最终以Na_2SiO_3和SiO_2二种分子形式存在并以微粒状分布在还原钨粉的表面。掺杂微量硅酸钠还使还原钨粉中的二次颗粒增加。
Trace amounts of sodium silicate were doped into tungsten blue oxide powders in the form of aqueous solution. The doped and undoped oxide powders were reduced into tungsten powders under the same conditions. It was shown that the average particle size of the reduced tungsten powder increased with the doping amount. The less amount of the dopant resulted in the increase of the powder apparent density. The observation by scanning electron microscope (SEM) and analysis by X-ray photoelectron spectrometry (XPS) on the surface of the reduced tungsten powders showed that the doped sodium silicate was finally in the forms of Na_2SiO_3 and SiO_2 fine particles, dispersively depositing on the surface of the reduced tungsten powders. Doping trace amounts of sodium silicate also increased secondary particles in the powders.
关键词
掺杂
硅酸钠
蓝色氧化钨
钨粉
Dope
Sodium silicate
Tungsten blue oxide
Tungsten powder
