摘要
探索了直接用实验测得的XPS图像强度来做元素或化学态相对定量分析的可能性。以AgCl和Na2 S2 O3样品为例 ,实验结果表明 :XPS图像强度与成像时间有良好的线性关系 。
We have explored the possibility of quantitative analysis based on the measurement of pixel intensity from the X-ray photoelectron spectrometric (XPS) image. The results for samples of AgCl and Na2S2O3 have shown, that there is a linear. relationship between pixel intensity and the acquisition time, and it is possible to do elemental or chemical state quantitative analysis by using the measured pixel intensities.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
2003年第9期1082-1084,共3页
Chinese Journal of Analytical Chemistry
