摘要
利用X 射线法 ,对GCr15不同回火组织进行激光表面淬火后所得的硬化层中残余奥氏体进行测量 ,并分析激光处理参数及原始组织对残余奥氏体的影响 .
Reminder austenite content was measured by the X-diffraction in the surface layer of the different tempered microstructure of GCr15 steel. Quenched by a laser, and the effect of the laser treatment parameter and initial microstructure on the reminder Austenite content was analysed.
出处
《天津理工学院学报》
2003年第1期65-68,共4页
Journal of Tianjin Institute of Technology
关键词
激光淬火
硬余奥氏体量
X-射线衍射
原始组织
laser quenching
remained Austenite content
X-ray diffraction
initial microstructure