摘要
简要地阐述了垂线仪的用途。揭示了原来垂线仪存在的问题。从而提出了用显微镜的一维移动完成二维坐标测量的装置。说明了测量原理,并给出了几种可行的光路结构。
This paper presents the uses of the vertical meter and reveals the problems of the primary one,put forward a new idea by which two-dimensional measurement can be completed by the linear move- ment of a microscope,including the principle of the measurement and several feasible optical structures.
出处
《光学机械》
CSCD
1992年第3期9-11,共3页
