摘要
JTAG边界扫描测试方法是电路芯片和电子系统功能测试一种新方法 ,正在得到越来越广泛的应用 .通过一个具体专用芯片的边界扫描测试的实现来介绍测试方法的基本原理 。
The testing method of JTAG boundary scan is a new method in verifying the function of the chip and electronic system. It will be used to test the VDDQ of VLSI in the turare. This paper discussed an ASIC'S boundary scan, introduced the principles of the testing method, the testing system's structure of hardware, and how to write a testing program.
出处
《辽宁大学学报（自然科学版）》
CAS
2003年第1期32-35,共4页
Journal of Liaoning University：Natural Sciences Edition
