摘要
孔径时间不确定性是影响快速波形记录仪动态性能的重要参数,叙述了快速信号在采样/保持器中的电气过程,介绍了如何用锁定直方图的方法测定孔径时间不确定性,讨论了采样时间间隔不确定性和孔径时间不确定性的异同。
The dynamic performance of fast digital waveform recorders is influenced by an important parameter-aperture uncertainty. The electrical Process in sample/hold circuit and the locked histogram test used to estimate aperture uncertainty are included. The difference between sampling interva uncertainty and aperture uncertainty in digital recorders is discussed.
出处
《高压电器》
CAS
CSCD
北大核心
1992年第4期36-41,共6页
High Voltage Apparatus
