摘要
高分辨γ探测技术是一种可靠的核弹头核查技术 .通过模拟计算和实验标定的方法 ,研究特定核弹头模型出壳γ射线强度与吸收材料厚度的关系 ,提出了一种简便的反解核弹头惰层厚度的方法 ,并讨论了该方法的应用条件 .
The high resolution γ ray detection technology is a kind of reliable technologies to verify nuclear warhead.In this paper,the relationship that the γ ray intensity emitting from warhead varies with the thickness of the absorber is studied by modeling calculation and experimental demarcation.A more compendious method to analyze the temper thickness and its application conditions are also discussed.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2003年第1期1-4,共4页
Acta Physica Sinica
