摘要
本文提出了一种测量波导窄壁上单缝天线导纳的新方法——归一化S参数法,这种方法可消除波导段引入的损耗及附加相移,不仅可精确测出单缝的电导值,而且还可测出电纳值。S波段缝隙天线导纳的测量结果与理论值吻合,证明了该方法的正确性。最后分析了主要误差源及减小测试误差的措施。
A new normalized S parameter method of measuring admittance of inclined slot antenna in the narrow wall of a rectangular waveguide is presented in this paper. Because attenuation and phase shift of measured waveguide section are deleted, we can obtain the conductance and susceptance of a slot accurately. The rightness of this method is examined by a close agreement between the theoretical and experimental results in S band. The error sources and the method of decreasing measurement error are described at last.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1992年第3期35-39,共5页
Acta Electronica Sinica
关键词
天线
等效网络
导纳
波导窄壁
Slot antenna, Normalized S parameters method, Equivalent network, Admittance, Narrow wall of a rectangular waveguide
