摘要
文章从通信产品高速数字电路单板在EMC试验中辐射发射超标入手,讨论了辐射发射产生的原因,并结合理论与实践,详细描述了解决高速电路辐射发射超标的过程。
The EMC test of high-speed digital circuit board of communication products indicates that the radiated emission often exceeds general limits. The reason why radiated emission occurs is discussed, and the process of reducing the radiated emission of a high-speed circuit is described in detail, both theoretically and practically.
出处
《中兴通讯技术》
2002年第6期46-49,共4页
ZTE Technology Journal
