摘要
目的 探讨妊娠期葡萄糖耐量受损 (im paired glucose tolerance test,IGT)与胰岛素抵抗之间的关系。 方法 选取 1999年 5月至 1999年 8月在上海市 11家医院产前检查 ,且葡萄糖耐量试验四项结果中有一项异常的孕妇 93例 ,随机选取无糖耐量受损的孕妇 179例 ,同时进行胰岛素释放试验 ,并计算胰岛素敏感性指数及胰岛分泌功能指数 ,比较两组胰岛素敏感性指数 (ISI)、胰岛分泌功能指数 (IFI)、空腹血糖 (PGO)、空腹胰岛素水平 (INO)、血糖曲线下面积 (SAUC)及胰岛素曲线下面积 (IAU C)的差异。 结果 葡萄糖耐量受损的 IGT组与正常组 PGO、IS0、SAUC、IAU C、及 ISI分别为 (5 .1± 1.0 ) m mol/ L 和 (4.3± 0 .4) mm ol/ L、(142± 77) pmol/ L 和 (114± 40 ) pm ol/ L、(2 3± 4)mm ol/ L 和 (18± 3) m mol/ L、 (1186± 437) pmol/ L 和 (10 5 8± 40 7) pm ol/ L、及 30± 2 0和 2 2± 2 4,两者比较差异均有显著性 (P<0 .0 5 )。而 IGT组与正常组 IFI分别为 2 8± 14和 2 6± 9,两组比较差异无显著性 (P>0 .0 5 )。 结论 胰岛素抵抗是 IGT的病因之一。
Objective To investigate the relationship between impaired glucose test and insulin resistance in pregnancy. Methods Ninety-three pregnant women who had one abnormal result among 4 of oral glucose tolerance test (OGTT) and 179 pregnant women who had normal results of OGTT from 11 hospitals of Shanghai during May 1999 to Aug 1999 were included. Insulin release test were performed at the same time. Insulin sensitive index (ISI), islet secretive function index (IFI) were calculated. Area under sugar curve (SAUC)?area under insulin curve (IAUC)?ISI? IFI?fast plasma sugar(PGO) and fast plasma insulin (INO) were compared between two groups. Results PGO, INO, SAUC, IAUC and ISI of the IGT group and control group were(5.1±1.0)mmol/L vs(4.3±0.4)mmol/L?(142±77) pmol/L vs (114±40)pmol/L?(1186±437) pmol/L vs (1058±407)pmol/L?(23±4) mmol/L vs (18±3)mmol/L and 30±20 vs 22±24 respectively, the differences were significant(P<0.05), and IFI of IGT group and control group were 28±14 vs 26±9 respectively, there was no significant difference(P>0.05). Conclusions Insulin resistance is one of the causes of impaired glucose test in pregnancy.
出处
《中华围产医学杂志》
CAS
2002年第4期245-247,共3页
Chinese Journal of Perinatal Medicine
