摘要
论文采用等温衰减电流法研究了在不同烧结温度下制备的陶瓷试样的陷阱分布。试验结果表明 ,烧结温度能够影响到氧化铝陶瓷介质的陷阱分布。微观结构分析表明 ,不同的烧结温度会导致陶瓷介质不同数量的结构缺陷 ,从而造成了它们陷阱分布的不同。
This paper studies the trap distribution of different alumina ceramic samples with the isothermal decay current method. The samples were made of alumina with the purity of 99.9% under varied sintering temperature. Experimental results show that the sintering temperature can affect the trap distribution of alumina ceramics significantly. The microstructure of samples show that sintering temperature causes the different contents of structure defects in ceramics bulk, hence the trap distributions of samples are different.
出处
《绝缘材料》
CAS
北大核心
2002年第6期40-42,45,共4页
Insulating Materials
