摘要
为解决恶劣环境中测试系统的测试难题,提出一种微型高过载测量装置的设计方案。该装置以STM32单片机为核心,利用单片机内部集成的ADC、SRAM和FLASH,结合加速度传感器和调理电路,采用双备份电池供电,在承受与被测对象相同的环境作用力下实时准确地获取被测对象的动态参数。该装置利用STM32单片机对传统存储测试装置进行了单元电路的二次集成,使测量装置的体积显著减小。经验证,该装置成功获取过载曲线,能够满足高动态环境下实时测量的需求。
To solve the testing problems of the test system in harsh environments,a design scheme of a micro high overload measurement device was proposed.The device took the STM32 microcontroller as the core,used the ADC,SRAM and FLASH integrated inside the microcontroller,combined the accelerometer and conditioning circuit,and used dual backup batteries to power,the dynamic parameters of the measured object were obtained in real time and accurately under the same environmental force as the measured object.The device used STM32 microcontroller to carry out the secondary integration of unit circuits of traditional storage test devices,so that the size of the measurement device was greatly reduced.The device was proved to be able to successfully acquire an overload curve to meet the needs of real-time measurement in a highly dynamic environment.
作者
万智旋
焦新泉
姜喜洋
WAN Zhixuan;JIAO Xinquan;JIANG Xiyang(Science and Technology on Electronic Test and Measurement Laborotory,North University of China;NorthUniversity of China,Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education)
出处
《仪表技术与传感器》
北大核心
2026年第2期52-55,共4页
Instrument Technique and Sensor
