摘要
基于Space Radiation 7.0软件,对500 km和1 100 km两条典型低地球轨道在不同空间天气(太阳极小、太阳极大与太阳耀斑)和不同屏蔽条件下的粒子辐射环境与剂量进行了计算分析,包括轨道离子谱、电离总剂量和位移损伤剂量。根据轨道离子谱,得到了不同线性能量传输(LET)值范围内的轨道离子通量。结果表明,在500 km轨道舱内、太阳极小条件下,当LET阈值从15 MeV·cm^(2)/mg提高至37 MeV·cm^(2)/mg时,对应的敏感离子通量从84/(cm^(2)·年)下降至0.016/(cm^(2)·年)。进一步计算了14 nm鳍式场效应晶体管(FinFET)工艺静态随机存取存储器(SRAM)在轨重离子错误率,在1 100 km轨道、太阳极小条件下的重离子翻转率为7.99×10^(-10)/(bit·d)。此外,通过对比舱内与舱外的电离总剂量和位移损伤剂量,发现舱外辐射剂量约为舱内剂量的10^(4)倍。研究结果可为典型低地球轨道的空间辐射防护设计与评估提供参考。
Based on the Space Radiation 7.0 software,the particle radiation environment and dose in two typical low Earth orbits of 500 km and 1100 km under different space weather conditions(solar minimum,solar maximum and solar flares)and different shielding conditions were calculated and analyzed,including orbital ion spectra,total ionization dose and displacement damage dose.Based on the orbital ion spectrum,the orbital ion fluxes within different ranges of linear energy transfer(LET)values were obtained.The results show that in the 500 km orbital module under solar minimum conditions,when the LET threshold increases from 15 MeV·cm^(2)/mg to 37 MeV·cm^(2)/mg,the corresponding sensitive ion flux decreases from 84/(cm^(2)·year)to 0.016/(cm^(2)·year).The in-orbit heavy ion error rate of the 14 nm FinFET process SRAM was further calculated.The heavy ion inversion rate under the solar minimum conditions at an orbit of 1110 km was 7.99×10^(-10)/(bit·d).Furthermore,by comparing the total ionization dose and displacement damage dose inside and outside the cabin,it was found that the radiation dose outside the cabin was approximately 10^(4) times that inside the cabin.The research results can provide references for the design and evaluation of space radiation protection in typical low Earth orbits.
作者
董玉凤
王志达
崔安定
王甜
肖远清
雷志锋
张战刚
DONG Yufeng;WANG Zhida;CUI Anding;WANG Tian;XIAO Yuanqing;LEI Zhifeng;ZHANG Zhangang(CEPREI,Guangzhou 511370,China;National Key Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component,Guangzhou 511370,China;ZTE Corporation,Shenzhen 518057,China)
出处
《电子产品可靠性与环境试验》
2026年第1期1-8,共8页
Electronic Product Reliability and Environmental Testing
基金
国家自然科学基金项目:面向航空应用的纳米FinFET器件大气中子单粒子效应机理及评价方法研究(12175045)资助。
关键词
低地轨道
空间辐射
电离总剂量
位移损伤剂量
low earth orbit
space radiation
total ionizing dose
displacement damage dose
