摘要
Defect detection in printed circuit boards(PCB)remains challenging due to the difficulty of identifying small-scale defects,the inefficiency of conventional approaches,and the interference from complex backgrounds.To address these issues,this paper proposes SIM-Net,an enhanced detection framework derived from YOLOv11.The model integrates SPDConv to preserve fine-grained features for small object detection,introduces a novel convolutional partial attention module(C2PAM)to suppress redundant background information and highlight salient regions,and employs a multi-scale fusion network(MFN)with a multi-grain contextual module(MGCT)to strengthen contextual representation and accelerate inference.Experimental evaluations demonstrate that SIM-Net achieves 92.4%mAP,92%accuracy,and 89.4%recall with an inference speed of 75.1 FPS,outperforming existing state-of-the-art methods.These results confirm the robustness and real-time applicability of SIM-Net for PCB defect inspection.
