摘要
康普顿背散射成像法是射线检测法中一项重要的技术,通过探测被照物体发射出来的康普顿散射光子对被照射物体进行成像,从而获得缺陷信息。本文将综述康普顿背散射检测方法,介绍康普顿背散射的基本原理,然后探讨基于康普顿背散射检测技术在墙体缺陷方面的国内外研究现状,最后总结并展望康普顿背散射成像检测法的未来发展前景。
Compton backscattering imaging is an important technique in the ray detection method.By detecting the Compton scattering photons emitted by the irradiated object,the irradiated object is imaged to obtain the defect information.This paper will review the Compton backscattering detection method,introduce the basic principle of Compton backscattering,and then discuss the research status of Compton backscattering detection technology in wall defects at home and abroad.Finally,the future development prospects of Compton backscattering imaging detection method are summarized and prospected.
作者
陈思雨
杨剑波
孙菀艺
黄鑫
张江
莫思特
CHEN Siyu;YANG Jianbo;SUN Wanyi;HUANG Xin;ZHANG Jiang;MO Site(School of Physics and Electronic Engineering,Sichuan University of Science&Engineering,Yibin,Sichuan 644000,China;College of Electrical Engineering,Sichuan University,Chengdu,Sichuan 610000,China)
出处
《光散射学报》
北大核心
2025年第4期527-533,共7页
The Journal of Light Scattering
基金
四川省重点研发项目(No.2024YFHZ0122)
宜宾科技局项目(2024SF012)
四川轻化工大学研究生创新基金项目(Y2024250)
核测量方法与智能装备“652”科研创新团队(SUSE652A001)资助。
关键词
康普顿背散射
缺陷检测
无损检测
Compton backscattering
Defect detection
Nondestructive testing
