摘要
针对传统国际MIPI协议层测试场景单一、成本高等问题,以及超高分辨率液晶覆硅(LCoS)微显示系统对高带宽和可靠性需求的挑战,本文提出一种基于现场可编程门阵列(FPGA)的自包含式MIPI协议层测试方法。在单芯片FPGA上实现硬件在环闭环,集成结构化随机序列生成器、MIPI发送端、接收端和实时比对模块。实验结果表明,在美国Lattice公司的CrossLink-NX FPGA上系统成功生成并验证了MIPI数据包,误差信号始终为低电平,有效验证了方案的可靠性。该方法成本低、集成度高,可满足超高分辨率LCoS等微显示领域的高速协议验证需求,为串行接口测试提供高效方案。
Conventional MIPI protocol layer testing often suffers from limited scenario coverage and high implementation cost,while ultra-high-resolution Liquid Crystal on Silicon(LCoS)microdisplay systems impose demanding requirements on bandwidth and reliability.To overcome these challenges,this study presents an FPGA-based self-contained testing scheme for the MIPI protocol layer.The method realizes a complete hardware-in-the-loop framework on a single FPGA,incorporating a structured random sequence generator,a MIPI transmitter,a MIPI receiver,and a real-time comparison unit.Validation on a Lattice CrossLink-NX FPGA confirms that the system can generate and check MIPI data packets reliably,with the mismatch signal consistently held at a logic-low level.These results verify the robustness of the proposed approach.By combining low cost with high integration,the method provides an effective solution for high-speed protocol verification in ultra-high-resolution LCoS microdisplays and other serial interface applications.
作者
马飞
赵博华
黄苒
MA Fei;ZHAO Bo-hua;HUANG Ran(Guangdong Hengqin Digital Optical Semiconductor Technology Co.,Ltd)
出处
《中国集成电路》
2025年第11期88-95,共8页
China lntegrated Circuit
基金
国家重点研发计划(2021YFB3600300)支持项目。
