摘要
高压大功率IGBT器件的可靠性评估对电力电子系统的长期稳定运行至关重要,但现有高温反偏(HTRB)测试设备存在温度控制精度不足、多通道安全隔离能力有限及失效特征捕获效率低等问题。研制了支持7 kV/250℃的多通道IGBT自动化测试设备,采用模温机与水冷板协同散热技术、高压隔离保护电路(瞬态电压抑制(TVS)二极管,其响应时间<100 ns)及自适应采样机制(1~1000 Hz动态切换),兼顾了热失控与数据采集效率。实验结果表明,该设备结温监测误差<1℃,可实现器件早期失效预警(漏电流达到初始值的5倍时触发预警),并在1300 h连续测试中保持零故障。研究成果为高压IGBT的可靠性验证提供了高精度、高安全性的测试平台,已成功应用于国产模块的HTRB评估。
The reliability evaluation of high-voltage high-power IGBT devices is critical for the longterm stable operation of power electronic systems.However,existing high-temperature reverse bias(HTRB)test equipment suffer from issues such as insufficient temperature control accuracy,limited multi-channel safety isolation capability and low failure feature capture efficiency.An automated multichannel IGBT test equipment supporting 7 kV/250℃ operation was developed,which employed the synergistic cooling technology combined the mold temperature controller with a water cooling plate,highvoltage isolation protection circuits(transient voltage suppressor(TVS)diode,whose response time<100 ns)and an adaptive sampling mechanism(dynamic switching from 1 Hz to 1000 Hz)to balance the thermal runaway and data acquisition efficiency.Experimental results show that junction temperature monitoring error is<1℃,and early failure warning can be achieved(be triggered when the leakage current reaches 5 times the initial value)and zero failure is maintained during 1300 h continuous testing.The research results provide a high-precision,high-safety testing platform for reliability verification of high-voltage IGBT and it has been successfully applied to HTRB validation of domestic modules.
作者
张永康
邓二平
王为介
吴立信
周宇豪
戴鹏
丁立健
Zhang Yongkang;Deng Erping;Wang Weijie;Wu Lixin;Zhou Yuhao;Dai Peng;Ding Lijian(School of Electrical Engineering and Automation,Hefei University of Technology,Hefei 230009,China;Institute of Energy,Hefei Comprehensive National Science Center,Hefei 230031,China;Locomotive&Car Research Institute,China Academy of Railway Sciences Group Co.,Ltd.,Beijing 100081,China;Beijing Zongheng Electro-Mechanical Technology Co.,Ltd.,Beijing 100094,China)
出处
《半导体技术》
北大核心
2025年第12期1244-1252,共9页
Semiconductor Technology
基金
国家自然科学基金(52577188)
动车组和机车牵引与控制国家重点实验室(中国铁道科学研究院集团有限公司)开放课题(2023YJ366)。
关键词
高温反偏(HTRB)测试
IGBT器件
漏电流监测
结温监测
自动化测试
high-temperature reverse bias(HTRB)testing
IGBT device
leakage current monitoring
junction temperature monitoring
automated testing
