期刊文献+

耳机充电底座的连续跌落仿真分析与实验

Simulation Analysis and Experiment of Continuous Drop of Headphone Charging Base
在线阅读 下载PDF
导出
摘要 目的解决单次跌落分析难以完全揭示产品在连续跌落测试中的真实表现,从而提升电子产品的开发效率。方法为了解决这一问题,本研究针对某头戴式耳机的充电底座,基于RADIOSS进行连续跌落仿真的研究。通过高速摄影机拍摄真实的多次连续跌落过程,与仿真结果进行对比,来验证连续跌落仿真的准确性。结果真实跌落中结构上盖和底盖的开口最大值为5.39 mm,仿真中的开口最大值为5.25 mm,仿真与实测数据基本相当。实验中螺丝柱的断裂位置也与仿真中的高应力区域相互对应。改进后的设计也顺利通过了测试。结论这种方法更贴近真实测试场景,全面考虑了残余应力、塑性应变和损伤的累积,从而提供了更准确的可靠性分析结果。通过采用这种方法,不仅可以缩短产品研发周期,而且能够显著提升产品的质量,为用户带来更加可靠和持久的使用体验。 The work aims to deal with the issue that single-drop analysis often fails to fully reveal a product's true performance during continuous drop tests,so as to improve the development efficiency of electronic products.Focusing on the charging base of an over-head headphones,continuous drop simulations were carried out with RADIOSS.High-speed cameras were used to capture the actual drop process,and the simulation results were compared to validate the accuracy of the continuous drop simulation.In the real drop test,the maximum opening of the structural upper cover and lower cover was 5.39 mm,while the maximum opening in the simulation was 5.25 mm,the simulation data was basically consistent with the measured data.Additionally,the fracture location of the screw boss in the experiment also corresponded to the high-stress area in the simulation.This method closely mirrors real-world testing scenarios by comprehensively considering the accumulation of residual stress,plastic strain and damage,thereby providing more accurate reliability analysis results.By adopting this approach,not only can the product development cycle be shortened,but product quality can also be significantly improved,offering users a more reliable and durable experience.
作者 高上地 GAO Shangdi(GN Netcom(China)Ltd.,Fujian Xiamen 361000,China)
出处 《包装工程》 北大核心 2025年第17期271-277,共7页 Packaging Engineering
关键词 连续跌落 数值仿真 损伤累积 动能松弛 continuous drop numerical simulation damage accumulation dynamic relaxation
  • 相关文献

参考文献8

二级参考文献59

共引文献40

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部