摘要
Ion-induced stability degradation is a critical factor limiting the power conversion efficiency and commercialization potential of perovskite-based solar cells.To mitigate ion migration in perovskite-baseddevices,various strategies,including defect passivation and ion optimization,have been extensivelyinvestigated from the device fabrication and integration perspectives,which,however,are often costlyand may negatively impact device efficiency.Notably,all-perovskite tandem solar cells(TSCs),whichexhibit more complex ion dynamics compared to single-junction devices,remain poorly understood.Inthis study,we employ comprehensive photoelectric coupling simulations in conjunction with a selfassembled light source compensation setup to elucidate ion dynamics in all-perovskite TSCs.Specifically,the hysteresis behavior at a defined scan rate is used to quantitatively characterize the extentof ion migration.Our findings reveal that enhanced ion migration occurs in current-limited sub-cells,whereas ion migration in higher-current sub-cells is attenuated due to differential voltage assignments.This study provides valuable insights into the device physics of ion migration in TSCs,facilitating effectivecontrol of ion behavior and offering essential guidance for the design of highly efficient and stable TSCs.©2025 Science China Press.Published by Elsevier B.V.and Science China Press.All rights are reserved.
基金
supported by the National Key Research andDevelopment Program of China(2022YFB4200901)
the NationalNatural Science Foundation of China(62120106001,62105126,and 62005188)
the Natural Science Foundation of Jiangsu Province(BK20210454)
China Postdoctoral Science Foundation(2023M731449)
Natural Science Research Project of JiangsuHigher Education Institutions(22KJA480003)
Priority AcademicProgram Development(PAPD)of Jiangsu Higher Education Institutions,and Postgraduate Research&Practice Innovation Program ofJiangsu Province(KYCX24_3296).
