摘要
超大规模芯片由单核发展到多核后,内部集成了更多的CPU、接口和存储单元等,为用户使用带来便利的同时也给可靠性测试带来了一定的挑战。为完成多核片上系统(SoC)芯片的可靠性测试,设计了一种基于自动测试设备(ATE)的多核SoC测试平台,在一个测试周期内通过ATE实现了芯片功能验证和参数测试,完成了多核SoC芯片的可靠性评估。
Very Large-Scale chips have evolved from Single-Core to Multi-Core,with more CPU,Interface,and Storage units integrated internally.While bringing convenience to users,it also poses challenges to reliability testing.In order to complete the reliability testing of Multi-Core SoC chips,a Multi-Core SoC test platform based on ATE is designed.Through the automatic test equipment,we manage the functional verification and parameter testing of the relevant chips within one test cycle,and complete the reliability assessment of the Multi-Core SoC device.
作者
杜勇
刘娟
李依凡
魏旗
Du Yong;Liu Juan;Li Yifan;Wei Qi(Xi′an TaiE Electronics Co.,Ltd.,Xi′an 710000,China)
出处
《质量与可靠性》
2025年第2期58-64,共7页
Quality and Reliability
