3[5]International Centre for Diffraction Data.Powder Diffraction File.Newtown Square,USA.
4[6]National Institute of Standards and Technology.Certificate standard reference material 640c silicon powder,line position and line shape standard for powder diffraction.Gaithersburg,USA:2000.
5[7]National Institute of Standards and Technology.Certificate standard reference material 1976,Instrument Sensitivity Standard for X-ray Powder Diffraction.Gaithersburg,USA:1991.
6[8]Schreiner W N,Jenkins R.Request for comments□A reference standard for determining instrumental response for X-ray powder diffraction.Powder Diffr.1990,5(4):204～205.
7[11]Blanton T N,Schreiner W N,Dann J N.JCPDS-International Centre for Diffraction Data.Statistical process control method development.Powder Diffr.1993,8(4):229～235.
8[12]American Society for Quality Control.Glossary & tables for statistical quality control.Milwaukee:ASQC Quality Press,1983.
9[13]Peplinski B,Wenzel J.Proficiency testing of instruments-a keyelement for quality assurance in X-ray powder diffraction.Part 1:Matching the effort to the actual needs.Mater Sci Forum.2000,321～324:144～149.
