摘要
高压电力电缆半导电缓冲层烧蚀导致电缆故障得到广泛关注和研究,但电缆缓冲层应用于电缆后,对绝缘屏蔽层与金属屏蔽层之间的电气接触性能评价,尚缺乏统一的评价方法、标准和装置。文中改进一种能够同时测试普通半导电缓冲层及含铜丝半导电缓冲层电气性能的方法,并研制相应的检测装置,用于各种电缆电气性能的检测。试验研究了测试电压、测试电流、电流密度,以及测试温度对接触电阻系数的影响,从而验证测试结果的稳定性。试验结果表明,测试电压、测试电流、电流密度应设置在合理范围内,过大或过小对测试结果影响较大,导致测试结果不稳定,可为后续工程现场及检测提供便利,并为后续标准的制定提供数据支持。
Cable failure caused by ablation of semi-conductive buffer layer of high voltage cable has received a lot of research attention.After the cable buffer layer applied to cable,there is no unified evaluation method,standard and device for electrical contact performance evaluation between insulation shielding layer and metal shielding layer of cable.A test method,electrical properties of gold cloth and common semi-conductive buffer layer could be tested at the same time was proposed,and corresponding testing device was developed.Influence of test voltage,test current,current density and test temperature on the contact resistance coefficient were studied,and stability of test results was tested.Results showed that test voltage,current,and current density should be set within a reasonable range,too large or too small had great influence on the test results,resulting in unstable test results,which could provide convenience for the subsequent engineering site and testing,and provide data support for the formulation of subsequent standards.
作者
施楠楠
夏俊峰
黄阳
SHI Nannan;XIA Junfeng;HUANG Yang(State Key Laboratory of Special Cable Technology,Shanghai Electric Cable Research Institute Co.,Ltd.,Shanghai 200093,China)
出处
《电线电缆》
2024年第3期36-40,共5页
Wire & Cable
关键词
高压电缆
缓冲层
测试装置
high voltage cable
buffer layer
test device
