摘要
Structured illumination microscopy(SIM)has become a widely used tool for insight into biomedical challenges due to its rapid,long-term,and super-resolution(SR)imaging.However,artifacts that often appear in SIM images have long brought into question its fidelity,and might cause misinterpretation of biological structures.We present HiFi-SIM,a high-fidelity SIM reconstruction algorithm,by engineering the effective point spread function(PSF)into an ideal form.HiFi-SIM can effectively reduce commonly seen artifacts without loss of fine structures and improve the axial sectioning for samples with strong background.In particular,HiFi-SIM is not sensitive to the commonly used PSF and reconstruction parameters;hence,it lowers the requirements for dedicated PSF calibration and complicated parameter adjustment,thus promoting SIM as a daily imaging tool.
基金
The work was supported by the National Key Research and Development Program of China[grant no.2017YFC0110100]
the National Natural Science Foundation of China[grant no.61805272].