摘要
TetraMAX ATPG作为业界性能较优的自动测试向量生成工具,能够使用较短时间产生高故障覆盖率的测试向量集.本文通过对TetraMAX ATPG产生的初始测试向量集进行建模,提出了基于最小集合覆盖求解方法的最小完备测试集生成方法,利用这一算法可以在保证测试向量集故障覆盖率不变的基础上有效地缩减测试集规模,从而降低电路测试成本.实验结果表明该方法对于固定故障类型和静态电路故障类型均具有良好的约简效果.
As an excellent ATPG toll,TetraMAX ATPG enable to generate a test pattern set with high fault coverage in a short time.In this paper,by re-modeling the basic test pattern set generated by TetraMAX ATPG,a method for computing an optimal test pattern set based on minimum set covering problem is proposed.This method models the test pattern set reduction problem as an instance of set coverage problem.It can effectively reduce the scale of test set on the basis of guaranteeing the invariable fault coverage of test set,thereby reducing the test cost of the circuit testing.According to the stuck-at fault and the IDDQ Fault,the experimentd results show that the method has good reduction effect on both of them.
作者
欧阳丹彤
郭江姗
张立明
OUYANG Dantong;GUO Jiangshan;ZHANG Liming(College of Computer Science and Technology,Jilin University,Changchun 130012,China;Key Laboratory of Symbol Computation and Knowledge Engineering(Jilin University),Ministry of Education,Changchun 130012,China)
出处
《湖南大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
2020年第12期61-68,共8页
Journal of Hunan University:Natural Sciences
基金
国家自然科学基金资助项目(61872159,61672261,61502199)。
