摘要
基于统计学思想,提出了寿命预测过程的逆向检验方法,通过Shapiro-Wilk检验验证试验数据的分布特性,通过方差齐性分析检验实验过程老化机理一致性,通过显著性检验对回归方程的显著性进行检验。文章将该方法应用于光电耦合器的寿命预测过程,通过提出的逆向检验方法验证后,所得预测结果与生产厂家提供的参考寿命接近。实验结果表明该方法能够有效地检验试验数据和评估模型的适用性,进一步提高光耦寿命预测的准确性,同时该方法对其他器件的寿命预测也具有一定的借鉴价值。
Based on statistics theories,a reverse test method was here proposed for the life prediction.The distribution of sampled data was verified by Shapiro-Wilk test.The consistency of the aging mechanism was tested by homogeneity analysis of variance.And the significance of the regression equation was examined by significance test.This method was then applied to the life prediction of optocouplers.The life span was predicted by the reverse test method,which was close to the reference provided by the manufacturer.The experimental results show that this method can verify the applicability of test data and the evaluation model,so as to further improve the accuracy of life prediction of optocoupler.Further,this method can also be applied in the life prediction of other components.
作者
石颉
孔维相
袁晨翔
赵德宇
陆群
SHI Jie;KONG Weixiang;YUAN Chenxiang;ZHAO Deyu;LU Qun(Suzhou University of Science and Technology,Suzhou 215009,Jiangsu Province,China)
出处
《电子元件与材料》
CAS
CSCD
北大核心
2020年第4期68-74,79,共8页
Electronic Components And Materials
