摘要
物理不可克隆函数(PUF)是一种新型的信息安全硬件,在物联网、消费电子等领域正得到越来越广泛的应用。由于易于设计和制造,而且性能稳定,基于SRAM的PUF是目前得到工业界最广泛应用的PUF类型。针对一款自主设计的基于华虹0.11μm CMOS工艺的SRAM PUF,通过设计FPGA测试电路,PUF芯片测试板,对PUF芯片的片内汉明距离、片间汉明距离、稳定性等关键指标进行了详细测试和分析。测试结果表明,该PUF的片间汉明距离达到42.2%,片内汉明距离20.0%,可以满足身份识别、电子标签等应用的需求。同时,提出了对不稳定位进行筛选的系统级优化方法,可以在不进行模糊提取的情况下将片内汉明距离降低到2.1%。
PUF(physically unclonable functions,PUF)is a new type of information security hardware primitive which becomes increasingly popular in the recent years.Among all PUF technologies,SRAM based PUF are the most widely used due to their ease of design and manufacturing,and stability over wide ranges of operation conditions.In this work,an in-house designed SRAM PUF chip using HHGrace 0.11μm CMOS technology is tested.An FPGA base test system is developed to facilitate the control of the PUF chip and the input/output data manipulation.The average inter-chip hamming distance is about 42.2%,and the average intra-chip hamming distance is about 20.0%,which can meet the requirements of IoT and consumer electronics applications.A bit masking scheme is also proposed to improve the stability of the PUF responses to 2.1%.
作者
刘登科
刘伟
宋贺伦
殷志珍
茹占强
吴菲
赵俊君
Liu Dengke;Liu Wei;Song Helun;Yin Zhizhen;Ru Zhanqiang;Wu Fei;Zhao Junjun(School of Nano Technology and Nano Bionics,University of Science and Technology of China,Hefei 230026,China;Suzhou Institute of Nano-Tech and Nano-Bionics,Chinese Academy of Sciences,Suzhou 215123,China)
出处
《电子测量技术》
2019年第17期88-94,共7页
Electronic Measurement Technology
基金
国家重点研发计划项目(2016YFE0129400)
国防基础科研重点项目(JCKY2017210B006)
中国科学院战略性先导科技专项(XDC02010900)
“十三五”国家密码发展基金(MMJJ20180112)项目资助
