摘要
表面是晶态固体原子在三维空间周期排列的终止处,它不同于体内环境。具有独特的局域化电子态和振动态。材料的许多性质与表面和界面状态有着密切的联系。从原子或分子级水平来研究表面的现代表面分析技术,是由能取得纳米(nm)级表面信息的能力来表征的。文中对四种实用表面分析技术,即AES、XPS、ISS和SIMS的进展作了综合性述评。综合表现在灵敏度、分辨率、数据采集和处理以及稳定性等方面的大幅度提高。但实验室间的数据比较表明,标准方法,校正步骤和数据库的建立仍是当务之急。
An essential special feature of modern techniques lays emphasis upon the roles of materials surface and interface. Much of our understanding of solids is based on the fact that they are, in essence, perfectly periodic in three dimensions. The introduction of a surface breaks this periodicity and can lead to structural changes as well as the introduction of localisod electronic and vibrational states. A variety of materials properties and performances are , therefore, closely related to surface and interface.
The state of arts in four practical surface analysis techniques, AES, XPS, ISS,SIMS, are then reviewed. Recent progress has led to improvements e.g. in sensitivity, spectra resolution, data acquisition and handling. The interlaboratory round robin tests showed the importance of standardized methods,correction procedures and certified data banks.
出处
《材料保护》
CAS
CSCD
北大核心
1992年第2期17-20,共4页
Materials Protection
