摘要
对串联谐振耐压试验回路的品质因数Q进行了分析。结合模拟试验 ,找出了影响Q值大小的原因 ,并对串联谐振回路中的等效损耗电阻R做了详细的研究 ,提出了新的看法。
The qualitative factor Q of series resonant circuit for voltage withstanding test is analyzed. By combining simulation test,the causes influencing on Q value are found.The equivalent loss resistance R of series resonant circuit is studied and a new opinion is presented.
出处
《高压电器》
CAS
CSCD
北大核心
2002年第4期52-54,共3页
High Voltage Apparatus
