摘要
针对胚胎电子细胞阵列中存在的故障自修复能力有限、资源利用率低、硬件资源消耗大等问题,设计了一种由簇内开关盒、簇内电子细胞和控制单元构成的电子细胞簇结构。基于这种结构提出了一种簇内基因移位的故障自修复方法。仿真实验以累计加法器为例,对电子细胞簇的功能进行了验证,并对电子细胞簇的硬件资源消耗和基于簇结构的电子细胞阵列可靠性进行了分析。仿真和分析结果表明,基于基因移位的故障自修复方法在修复故障的同时可有效保存时序电路的中间状态,而且随着阵列规模的增大,基于簇的电子细胞阵列平均失效前时间更长,硬件资源消耗更低。
Embryonics array is limited by the poor self-repairing ability,low resource utilization and high hardware resource consumption. In order to solve these problems,a novel kind of electronic cluster composed of inner switch,inner cells and control unit is proposed. Based on the cluster architecture,a gene shifting self-repairing method is proposed. In the simulation,the electronic cluster is configured as an accumulative adder,and the functions of the electronic cluster are verified. Hardware resource consumption of electronic cluster and the reliability of array are analyzed. Simulated and analyzed results show that the gene shifting self-repairing method can be used to repair the faults effectively,and the intermediate states of sequence circuit can be saved. And as the array size increases,the mean time to failures of the array based on electronic clusters is longer,and the hardware resource consumption is lower.
作者
李丹阳
蔡金燕
孟亚峰
朱赛
LI Dan-yang;CAI Jin-yan;MENG Ya-feng;ZHU Sai(Department of Electronic and Optical Engineering, Shijiazhuang Campus, Army Engineering University, Shijiazhuang 050003, Hebei, China;China Luoyang Electronics Equipment Test Center, Luoyang 471003, Henan, China)
出处
《兵工学报》
EI
CAS
CSCD
北大核心
2018年第3期537-552,共16页
Acta Armamentarii
基金
国家自然科学基金项目(61601495)
