摘要
提出一种面向嵌入式系统设计过程的全面测试过程模型,针对嵌入式系统复杂性增加导致系统性能测试难度急剧增加、从而影响系统的安全性和稳定性的问题,充分考虑嵌入式系统设计的全寿命周期,将系统功能和性能测试融入系统设计的各个阶段,能够及早发现系统设计过程中的缺陷和不足,提升系统设计效率和系统稳定性。
A comprehensive testing process model for embedded system design process is proposed, in order to solve the problem of increasing complexity of embedded system, which would dramatically increase the test difficulty of embedded system, and would thus affect the system’s security and stability. In this model, the whole life cycle of embedded system design is fully considered, and the measure of the system function and performance is integrated into all stages of system design, which could make the defects and deficiencies to be found as soon as possible, and thus improves the system’s design efficiency and stability.
出处
《信息通信》
2018年第2期86-87,共2页
Information & Communications
基金
航空基金资助项目(2015ZC31005)
关键词
嵌入式系统
设计周期
全面测试过程
性能测试
embedded system
whole life cycle of system design
comprehensive testing process
performance testing
