摘要
随着大功率电子对抗技术的不断发展,频率选择表面(FSS)结构的功率耐受问题成为亟待解决的技术难题,而国内外鲜有相关报道。本文主要针对此问题展开了理论和仿真分析,并通过典型样件的试验结果对分析结果进行了验证。首先通过将电磁场理论和经典传热学理论相结合,对带有FSS结构和纯介质结构典型样件的功率耐受问题进行了理论建模和分析。然后,在多物理场仿真环境下对FSS加载夹层结构和纯介质夹层结构的典型样件在微波照射效应下的温升效应进行了建模和功率耐受性能计算。最后,制作了符合理论模型的FSS结构和纯介质结构典型样件,在微波暗室内对其功率耐受性能进行了实测验证。结果表明,在相同介质厚度的情况下,带有FSS结构的典型样件在同等强度的微波激励下会产生更高的温升。
The thermostability problem of frequency selective surface（FSS） needs to be solved with the development of high power electronic countermeasure technology,and few reports are found at home and abroad. In this paper,the theory and simulation analysis of this problem are carried out,and the results are verified by the experimental results of typical samples. First of all,the heat resistance problem of the equivalent plate FSS and pure dielectric structure are modeled and analyzed based on the combination of electromagnetic field theory and classical heat transfer theory. Then,both the sandwich FSS plate structure and pure dielectric sandwich plate structure are analyzed under the microwave irradiation. The temperature rise effects are simulated caused by microwave radiation. Finally,the sandwich FSS and sandwich dielectric models are fabricated. The power withstand performances are tested in anechoic chamber. If each layer thickness of the sandwich dielectric is same,the temperature of sandwich FSS is higher.
出处
《微波学报》
CSCD
北大核心
2017年第4期32-35,40,共5页
Journal of Microwaves
