摘要
随着集成电路技术的发展,电路从原来的单一电源域向多电源域进行转移,而其中的静电放电(ESD)试验是考核集成电路性能的一项重要指标,如何有效选择合适的试验方法变得越来越重要。结合国内外相关静电放电试验标准,研究标准之间存在的相同和不同的地方。结合实际情况,探究多电源域集成电路静电放电试验方法的选择。
Along with the development of technology of integrated circuits, circuit has evolved from single power domain to multiple ones. Electro-Static discharge （ESD） has become an important index assessing the IC performance. Effective choice of test methods has been increasingly important. The article explores the choice of test methods for multi-domain ICs by comparing domestic and international ESD standards.
出处
《电子与封装》
2017年第3期26-28,共3页
Electronics & Packaging
