摘要
随着芯片运行速度不断提高,对串扰时延的测试已成为一个迫切需要解决的问题;文中提出一种面向多条攻击线的受害线上最大串扰噪声的测试生成方法;此方法建立了串扰通路时延故障模型、分析了布尔可满足性问题、讨论了七值逻辑,研究了串扰时延故障测试转换为CNF的逻辑表达式,在非鲁棒测试条件下约简CNF范式,并提出了串扰时延故障的SAT-ATPG算法;最后通过实例分析,对本文算法进行验证;结果表明:该算法对串扰时延故障的测试矢量的生成是有效的。
As the improvement of chip operating speeds so it is high time to consider and take some measures to solve the problem. A test -generation method based on multiple crosstalk -induced glitch fault model is proposed. In this method ？ it discusses Boolean satisfiability problem and analyse the crosstalk path delay fault model as well as Seven value logic of test vectors. It also analyse the mathematical logical expression converted by the crosstalk path delay fault model. And simplified CNF expression under the condition of non robust test？ then a SAT-ATPG test algorithm of crosstalk delay fault is proposed. Finally？ the algorithm is verified by specific example and the performance of the algorithm is effective for crosstalk -induced delay faults.
出处
《计算机测量与控制》
2017年第3期18-21,共4页
Computer Measurement &Control
关键词
串扰时延故障
布尔可满足性
时延测试
crosstalk delay fault
Boolean Satisfiability
delay faults testing
