摘要
固态开关同步性的好坏决定了其使用寿命的长短,影响开关同步性的主要因素为功率器件自身参数的分散性和驱动信号的同步性。为提高驱动信号的同步性,提出使用带有波形整形芯片的驱动电路对驱动芯片进行筛选,以选取参数更相近的芯片。通过示波器测量整形前后控制信号的波形,对比了波形上升沿和下降沿时间的变化,分析了波形整形效果。为降低功率器件分散性,对功率器件的模块进行筛选。实测结果表明,整形电路取得了较好的整形效果,可以用于筛选电路中。筛选的主要步骤为测量输出脉冲波形的上升沿和下降沿时间,然后以聚类分析为手段,使用最短距离法计算测量结果之间的距离,通过软件编程得到器件的二叉聚类树,最终完成芯片聚类,从聚类结果中得到适合于固态开关用途的驱动芯片和IGBT。器件筛选有助于提高固态开关的通断同步性,同时该方法也适合于筛选其他类型的芯片。
The quality of solid state switch synchronization determines the length of life. The main factors affecting the switching synchrony are the dispersion parameters of the power device and synchronization of the drive signal. In order to improve the synchronization of the drive signal, the drive circuit with waveform shaping chip is proposed to screen the similar parameter drive chips. The control signal waveforms are measured by the oscilloscope both before and after shaping. The rising time and falling time of the waveform changes are contrasted. The waveform shaping effects are analyzed. IGBT modules are screened in order to reduce the dispersion parameters. The measuring results show that the shaping circuit achieves better effect which can be used for device screening. The main steps for screening devices are as follows. First, measure the rise time and the fall time of the pulse waveform are measured, then the shortest distance method is used to calculate the distance between the measuring results by means of cluster analysis, finally clustering of the chip is complete by the binary clustering tree of devices through software programming. The drive chips and IGBTs which are suitable to the solid state switch are got from the cluster results. Device cluster is helpful to improve the synchronization of solid state switches. This method is also suitable for other types of chips.
出处
《控制工程》
CSCD
北大核心
2016年第11期1836-1840,共5页
Control Engineering of China
基金
福建省中青年教师教育科研项目资助(JB13242)
关键词
固态开关
器件筛选
聚类分析
Solid state switch
device screening
cluster analysis
