摘要
搭建了一套基于Photo-CELIV测量载流子迁移率的实验系统。采用Nd^(3+):YAG脉冲激光器作为诱导光源,在1~20 Hz的工作频率下,实验系统可输出波长为532 nm、脉宽为10 ns的激光脉冲,其能量在0.1~1 mJ范围内可调,光斑直径小于2 mm,激光器持续工作5 h后的能量不稳定度为±8%。该研究为半导体材料载流子迁移率的测量提供了一定的参考。
An experimental system for measuring carrier mobility based on Photo-CELIV is built. With a pulsed Nd3＋ ：YAG laser as an induction light source and under the operating frequency ranging from 1 Hz to 20 Hz, the whole system has an output laser with a wavelength of 532 nm, a pulse width of 10 ns, the tunable energy ranging from 0.1 mJ to 1 mJ, and a spot diameter being less than 2 mm. The laser energy instability after continuous work over 5 h is ±8%. The study here provides certain reference for the measurement of carrier mobility in semiconductor materials.
出处
《激光与光电子学进展》
CSCD
北大核心
2016年第10期168-172,共5页
Laser & Optoelectronics Progress
基金
国家863计划(2012AAXXX090)
